Delivering unparalleled XRF service and quality for over two decades.
New Bowman XRF Equipment for Sale
- 30-Second Calibrations once per month (solid-state detectors, no more daily calibrations).
- Same-Day Support - No hoops to jump through for assistance.
- 200+ Bowman Units installed in the Western US, just ask for a reference.
- Cost-Effective Brand New Technology, not an old design repackaged.
X-RAY NOW has a full lineup of new Bowman XRF equipment for sale that provides accurate and efficient XRF measurements. Being in the XRF business for over 20 years, we fully believe in the instruments we offer and their XRF measurement capabilities.
If you have any questions about our new XRF equipment for sale, please don’t hesitate to call us at 714-396-2519 or send an email to sales@xraynow.com.
Bowman is a new generation of XRF instruments built by the team that designed the CMI XRF systems. This next-generation CMI has 7x better Detector resolution with better stability and sensitivity. It is built on a modular platform that allows for easy service and provides big cost savings over the lifespan of the system. We call it smart engineering. This allows us to sell these XRFs at a very good price point. Translation, nobody beats our price.
- Silicon Drift Detectors (SDD), and Large SDD Detectors provide greater resolution, stability, and sensitivity
- Applications - All Standard XRF Applications (Including ENIG, ENEPIG, And Electroless Nickel % P Analysis)
- Only Manufacturer to have a IPC 4552A / B and 4556 performance guarantee
- Fast, non-destructive analysis within seconds
- Simultaneous composition analysis of up to 25 elements
- Measure up to five coating layers simultaneously, any two of which can be alloys
- Fundamental Parameters (FP)-driven standard-less thickness and composition analysis
- Easy setup and operation - one USB cable connection
- Simple front panel controls
- Small footprint and lightweight
- Precision analysis range from Titanium 22 to Uranium 92 (Ti 22 U 92)
- For Coating Thickness measurement,
- Elemental Analysis,
- Plating Solution measurement.
- Made in U.S.A, Chicago, IL
POLY-CAPILLARY OPTICS (U-SPOT ) XRF - Quickly Measure Small Features
BOWMAN is proud to introduce the second generation of cutting-edge XRF instrumentation, the X-Ray Optics System. The small spot, high flux x-ray beam, and large window SDD detector combine for unmatched speed and performance. It can be the perfect tool for minimizing wasted time, money, and materials.
- Poly-capillary optics achieve a hundred times higher flux than collimation system at the same distance from the source
- 7.5 um, 15um, or 80 um spot sizes are available
- This provides the best precision at the shortest test time with a small spot
- Flux Density Gain Up To 5 Orders Of Magnitude Compared To Collimator
- Thin coating measurements on Wafers, PCB, lead frames, and thin wires
FROM CMI TO BOWMAN
Bowman was founded by the technical team that established CMI International and successfully grew the company to become a respected leader in XRF plating thickness measurement.
Bowman offers customers the advantage of more than five decades of combined experience in the coating thickness measurement and elemental analysis industry...
Why Solid-State Detectors?
Increased Resolution | No Daily Calibrations Required | Improved Accuracy & Repeatability | Not 40+ Year Old Technology
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